Self-reference extended depth-of-field quantitative phase microscopy

Discontinued Devices LC-R 2500 Spatial Light Modulators
Microscopy
Published on:
Authors: Jaeduck Jang, Chae Yun Bae, Je-Kyun Park, and Jong Chul Ye
Abstract:

“This paper describes a novel quantitative phase microscopy based on a simple self-referencing scheme using Michelson interferometry. In order to achieve the homogeneous reference field for accurate phase measurement, the imaging field-of-view (FOV) is split onto the sample and homogenous background areas. The reference field can be generated by rotating the relative position of the sample and homogenous background in the object arm. Furthermore, our system is realized using an extended depth-of-field (eDOF) optics, which allows quantitative phase measurement for an increase of the depth-of-field without moving objective lens or specimen. The proposed method is confirmed by experimental results using various samples such as polystyrene beads and red blood cells (RBCs).”

Restricted Access

Publication: SPIE Proceedings
Issue/Year: Proc. SPIE 7570, 757018 (2010)
DOI: 10.1117/12.843082
Link: https://doi.org/10.1117/12.843082

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