Dynamic speckle illumination microscopy with wavelet prefiltering

Discontinued Devices LC-R 768 Spatial Light Modulators
Microscopy Misc.: Speckle / Characterization / Metrology
Published on:
Authors: Cathie Ventalon, Rainer Heintzmann, and Jerome Mertz
Abstract:
“Dynamic speckle illumination (DSI) provides a simple and robust technique to obtain fluorescence depth sectioning with a widefield microscope. We report a significant improvement to DSI microscopy based on a statistical image-processing algorithm that incorporates spatial wavelet prefiltering. The resultant gain in sectioning strength leads to a fundamentally improved scaling law for the out-of-focus background rejection.”

Restricted Access

Publication: Optics Letters
Issue/Year: Optics Letters, Vol. 32, Issue 11, pp. 1417-1419
DOI: 10.1364/OL.32.001417
Link: https://doi.org/10.1364/OL.32.001417

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