Optische Verarbeitung von interferometrischen Streifenbildern und die Fehlererkennung durch Wavelet-Filterung (Optical Processing of Interferometric Fringes and Detection of Faults by Wavelet Filtering)

Discontinued Devices LC 2002 Spatial Light Modulators
Imaging/ Image Processing Misc.: Speckle / Characterization / Metrology
Published on:
Authors: F. Kallmeyer, G. Wernicke, S. Krüger, H. Gruber, W. Osten, D. Kayser
Abstract:
“Das Erkennen und Klassifizieren von Fehlern ist eine wichtige Aufgabe der optischen zerstörungsfreien Materialprüfung in der industriellen Qualitätskontrolle. Eine Vielzahl von Daten über Fehler im Material sind in interferometrischen Streifenmustern enthalten. Diese Daten müssen für die weitere Auswertung reduziert werden. Eine Möglichkeit der Datenreduktion ist durch die Wavelet-Transformation gegeben. Fehler in interferometrischen Streifenmustern sollen durch Wavelet-Filter erkannt, lokalisiert und klassifiziert werden. Wavelet-Funktionen sind sowohl im Ortsraum als auch im Frequenzraum lokalisiert und eignen sich deshalb zur Extraktion von Merkmalen ohne Verlust der räumlichen Zuordnung. Eine Klassifizierung der Interferogramme ist möglich, da die Fehlerklassen charakteristische Eigenschaften haben, die mit bestimmten Klassen von Wavelet-Filtern erkannt werden können._x000D_ _x000D_ The detection and classification of faults is a major task for optical non-destructive testing in industrial quality control. Interferometric fringes contain a large amount of data with information about possible defect structures. These data must be reduced for further evaluation. One possible way is the filtering of the images by the adaptive wavelet transform. Faults in interferometric fringe patterns should be detected, localised, and classified by wavelet filters. Wavelet functions are localised in the spatial as well as in the frequency domain. Therefore both the extraction and the localisation of faults is possible by the application of wavelet filters. A classification of interferograms can be realised, because the fault classes have characteristics detectable with a given class of wavelet filters.”

Restricted Access

Publication: tm – Technisches Messen
Issue/Year: tm – Technisches Messen, Volume: 70, Issue: 2, Pages 66-70, 2003
DOI: 10.1524/teme.70.2.66.20110
Link: https://doi.org/10.1524/teme.70.2.66.20110

Related Papers

LC 2012 Spatial Light Modulators
Authors:Weng, Xiaojing / Feng, Ji / Perry, Altai / Vuong, Luat T.

Non-Line-of-Sight Full-Stokes Polarimetric Imaging with Solution-Processed Metagratings and Shallow Neural Networks

Applications: Deep Learning / Neuronal Network,Imaging/ Image Processing,Polarization Generation
GAEA Spatial Light Modulators
Authors:Tilmon, Brevin; Sun, Zhanghao; Koppal, Sanjeev; Wu, Yicheng; Evangelidis, Georgios; Zahreddine, Ramzi; Krishnan, Guru; Ma, Sizhuo & Wang, Jian

Energy-Efficient Adaptive 3D Sensing

Applications: Digital-/ Computer Holography/ CGH,Imaging/ Image Processing,Misc.: Speckle / Characterization / Metrology
PLUTO / PLUTO-2 Spatial Light Modulators
Authors:Zhou, Chaohui; Xin, Jun; Li, Yanan; Lu, Xiao-Ming

Measuring small displacements of an optical point source with digital holography

Applications: Digital-/ Computer Holography/ CGH,Imaging/ Image Processing
LC 2012 Spatial Light Modulators
Authors:Tsukada, Takumi / Watanabe, Wataru

Central wavelength estimation in spectral imaging behind a diffuser via deep learning

Applications: Deep Learning / Neuronal Network,Imaging/ Image Processing,Misc.: Speckle / Characterization / Metrology
PLUTO / PLUTO-2 Spatial Light Modulators
Authors:Han, Tongyu; Peng, Tong; Li, Runze; Wang, Kaige; Sun, Dan & Yao, Baoli

Extending the Imaging Depth of Field through Scattering Media by Wavefront Shaping of Non-Diffraction Beams

Applications: Bessel-/ Airy Beam Generation,Imaging/ Image Processing,Turbid-/ Opaque Media /Multi Scattering
PLUTO / PLUTO-2 Spatial Light Modulators
Authors:Zhou, Dongxu; Zhang, Lu; Zhang, Hongzhi; Zhang, Guoquan

Ghost images with controllable visibility and spatial resolution

Applications: Imaging/ Image Processing,Misc.: Speckle / Characterization / Metrology
PLUTO / PLUTO-2 Spatial Light Modulators
Authors:Torres-Sepúlveda, Walter; lveda; Mira-Agudelo, Alejandro; Barrera-Ramirez, John Fredy & Kolodziejczyk, Andrzej

Objective method for visual performance prediction

Applications: Adaptive Optics / Wavefront Control,Misc.: Speckle / Characterization / Metrology
PLUTO / PLUTO-2 Spatial Light Modulators
Authors:Ye, Zhiyuan; Hou, Wanting; Zhao, Jilun; Wang, Hai-Bo & Xiong, Jun

Computational holographic ghost diffraction

Applications: Imaging/ Image Processing,Phase Measurement / Phase Retrieval
PLUTO / PLUTO-2 Spatial Light Modulators
Authors:Yudaev, Andrey; Kiselev, Alexander; Shashkova, Inna; Tavrov, Alexander; Lipatov, Alexander & Korablev, Oleg

Wavefront Sensing by a Common-Path Interferometer for Wavefront Correction in Phase and Amplitude by a Liquid Crystal Spatial Light Modulator Aiming the Exoplanet Direct Imaging

Applications: Adaptive Optics / Wavefront Control,Imaging/ Image Processing,Phase Measurement / Phase Retrieval
LETO / LETO-3 Spatial Light Modulators
Authors:Khuderchuluun, Anar; Dashdavaa, Erkhembaatar; Rupali, Shindae; Kwon, Ki-Chul; Kang, Hoonjong; Lee, Kwon-Yeon & Kim, Nam

Color optimization of a full-color holographic stereogram printing system using a single SLM based on iterative exposure control

Applications: Digital-/ Computer Holography/ CGH,Materials Processing / Optical Fabrication,Misc.: Speckle / Characterization / Metrology
GAEA Spatial Light Modulators
Authors:Wilm, Tobias; Wieland, Max; Fiess, Reinhold & Stork, Wilhelm

Highly transparent wave front printed volume holograms realized by amplitude-modulated incoherent pre-illumination

Applications: Beam Shaping / Beam Steering,Materials Processing / Optical Fabrication,Misc.: Speckle / Characterization / Metrology
LC 2012 Spatial Light Modulators
Authors:Neto, Jose Reinaldo da Cunha Santos Aroso Vieira da Silva; Nakamura, Tomoya; Makihara, Yasushi & Yagi, Yasushi

Extended Depth-of-Field Lensless Imaging using an Optimized Radial Mask

Applications: Imaging/ Image Processing
LC 2012 Spatial Light Modulators
Authors:Arriaga-Hernandez, Jesus; Cuevas-Otahola, Bolivia; Oliveros-Oliveros, Jacobo; Morin-Castillo, Maria; Martinez-Laguna, Ygnacio & Cedillo-Ramirez, Lilia

Simulated LCSLM with Inducible Diffractive Theory to Display Super-Gaussian Arrays Applying the Transport-of-Intensity Equation

Applications: Adaptive Optics / Wavefront Control,Higher Order Modes / Optical Vortex / OAM,Misc.: Speckle / Characterization / Metrology
PLUTO / PLUTO-2 Spatial Light Modulators
Authors:Rowe, Connor M. L.; Cortes, Luis Romero; de Chatellus, Hugues Guillet; Seghilani, Mohamed & Azana, Jose

Generalized Talbot Self-Healing of Periodic Images

Applications: Imaging/ Image Processing
PLUTO / PLUTO-2 Spatial Light Modulators
Authors:Reda, Francesco; Salvatore, Marcella; Borbone, Fabio; Maddalena, Pasqualino; Ambrosio, Antonio & Oscurato, Stefano Luigi

Varifocal diffractive lenses for multi-depth microscope imaging

Applications: AR/VR/MR / Holographic Display,Imaging/ Image Processing,Lithography
PLUTO / PLUTO-2 Spatial Light Modulators
Authors:León Schweickhardt, Andreas Tausendfreund, Dirk Stöbener, and Andreas Fischer

Parametric characterization of ground surfaces with laser speckles

Applications: Adaptive Optics / Wavefront Control,Misc.: Speckle / Characterization / Metrology
PLUTO / PLUTO-2 Spatial Light Modulators
Authors:Khorin, Pavel A.; Porfirev, Alexey P. & Khonina, Svetlana N.

Adaptive Detection of Wave Aberrations Based on the Multichannel Filter

Applications: Adaptive Optics / Wavefront Control,Misc.: Speckle / Characterization / Metrology
PLUTO / PLUTO-2 Spatial Light Modulators
Authors:Mao, Baiwei; Liu, Yange; Chang, Wenzhe; Chen, Liang; Feng, Mao; Guo, Huiyi; He, Jiangyong & Wang, Zhi

Singularities splitting phenomenon for the superposition of hybrid orders structured lights and the corresponding interference discrimination method

Applications: Higher Order Modes / Optical Vortex / OAM,Misc.: Speckle / Characterization / Metrology
GAEA Spatial Light Modulators
Authors:Wu, Peng; Zhang, Dejie; Yuan, Jing; Zeng, Shaoqun; Gong, Hui; Luo, Qingming & Yang, Xiaoquan

Large depth-of-field fluorescence microscopy based on deep learning supported by Fresnel incoherent correlation holography

Applications: Digital-/ Computer Holography/ CGH,Microscopy,Misc.: Speckle / Characterization / Metrology
PLUTO / PLUTO-2 Spatial Light Modulators
Authors:Thais L. Silva, Łukasz Rudnicki, Daniel S. Tasca, and Stephen P. Walborn

Discretized continuous quantum-mechanical observables that are neither continuous nor discrete

Applications: Misc.: Speckle / Characterization / Metrology,Optical Computing / Quantum Optics
Spatial Light Modulators
Authors:Cheremkhin, Pavel; Evtikhiev, Nikolay; Krasnov, Vitaly; Ryabcev, Ilya; Shifrina, Anna & Starikov, Rostislav

Lensless Optical Encryption of Multilevel Digital Data Containers Using Spatially Incoherent Illumination

Applications: Digital-/ Computer Holography/ CGH,Imaging/ Image Processing,Optical Communication
GAEA Spatial Light Modulators
Authors:Idicula, Moncy Sajeev; Kozacki, Tomasz; Józwik, Michal; Mitura, Patryk; Martinez-Carranza, Juan & Choo, Hyon-Gon

Multi-Incidence Holographic Profilometry for Large Gradient Surfaces with Sub-Micron Focusing Accuracy

Applications: Digital-/ Computer Holography/ CGH,Misc.: Speckle / Characterization / Metrology
LC-R 720 Spatial Light Modulators
Authors:Liu, Xuan; Wan, Zhaoxiong; Zhang, Yuanwei & Liu, Yuwei

Optically computed phase microscopy for quantitative dynamic imaging of label-free cells and nanoparticles

Applications: Imaging/ Image Processing,Microscopy
LC 2012 Spatial Light Modulators
Authors:Lai, Xuetian; Li, Qiongyao; Chen, Ziyang; Shao, Xiaopeng & Pu, Jixiong

Reconstructing images of two adjacent objects passing through scattering medium via deep learning

Applications: Imaging/ Image Processing,Turbid-/ Opaque Media /Multi Scattering