Optische Verarbeitung von interferometrischen Streifenbildern und die Fehlererkennung durch Wavelet-Filterung (Optical Processing of Interferometric Fringes and Detection of Faults by Wavelet Filtering)

Discontinued Devices LC 2002 Spatial Light Modulators
Imaging/ Image Processing Misc.: Speckle / Characterization / Metrology
Published on:
Authors: F. Kallmeyer, G. Wernicke, S. Krüger, H. Gruber, W. Osten, D. Kayser
Abstract:

“Das Erkennen und Klassifizieren von Fehlern ist eine wichtige Aufgabe der optischen zerstörungsfreien Materialprüfung in der industriellen Qualitätskontrolle. Eine Vielzahl von Daten über Fehler im Material sind in interferometrischen Streifenmustern enthalten. Diese Daten müssen für die weitere Auswertung reduziert werden. Eine Möglichkeit der Datenreduktion ist durch die Wavelet-Transformation gegeben. Fehler in interferometrischen Streifenmustern sollen durch Wavelet-Filter erkannt, lokalisiert und klassifiziert werden. Wavelet-Funktionen sind sowohl im Ortsraum als auch im Frequenzraum lokalisiert und eignen sich deshalb zur Extraktion von Merkmalen ohne Verlust der räumlichen Zuordnung. Eine Klassifizierung der Interferogramme ist möglich, da die Fehlerklassen charakteristische Eigenschaften haben, die mit bestimmten Klassen von Wavelet-Filtern erkannt werden können.

The detection and classification of faults is a major task for optical non-destructive testing in industrial quality control. Interferometric fringes contain a large amount of data with information about possible defect structures. These data must be reduced for further evaluation. One possible way is the filtering of the images by the adaptive wavelet transform. Faults in interferometric fringe patterns should be detected, localised, and classified by wavelet filters. Wavelet functions are localised in the spatial as well as in the frequency domain. Therefore both the extraction and the localisation of faults is possible by the application of wavelet filters. A classification of interferograms can be realised, because the fault classes have characteristics detectable with a given class of wavelet filters.”

Restricted Access

Publication: tm – Technisches Messen
Issue/Year: tm – Technisches Messen, Volume: 70, Issue: 2, Pages 66-70, 2003
DOI: 10.1524/teme.70.2.66.20110
Link: https://doi.org/10.1524/teme.70.2.66.20110

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