Author(s): Reto Fiolka, Kai Wicker, Rainer Heintzmann, and Andreas Stemmer


“We present a novel microscopy technique to measure the scattered wavefront emitted from an optically transparent microscopic object. The complex amplitude is decoded via phase stepping in a common-path interferometer, enabling high mechanical stability. We demonstrate theoretically and practically that the incoherent summation of multiple illumination directions into a single image increases the resolving power and facilitates image reconstruction in diffraction tomography. We propose a slice-by-slice object-scatter extraction algorithm entirely based in real space in combination with ordinary z-stepping. Thereby the computational complexity affiliated with tomographic methods is significantly reduced. Using the first order Born approximation for weakly scattering objects it is possible to obtain estimates of the scattering density from the exitwaves.”

Link to Publications Page

Publication: Optics Express
Issue/Year: Optics Express, Vol. 17, Issue 15, pp. 12407-12417 (2009)
DOI: 10.1364/OE.17.012407