Author(s): Luis Camacho, Vicente Micó, Javier García, Zeev Zalevsky


“In many practical microscopy applications the use of phase information is crucial. In this contribution we propose a method for phase extraction in a microscopy system based on analysis of images with varying defocusing. The system has no mobile parts owing to the defocusing by means of a spatial light modulator. The base of the method is the captre of images in a microscope with varying tube lens focal lengths. This produce a set of intensity images, all of them related, because the can be generated by free space propagation of a complex distribution which is unknown.”

Link to Publications Page

Publication: SPIE Proceedings, (subscription required)

Issue/Year/DOI: Proc. SPIE 8082, 80820O (2011);