Author(s): Cathie Ventalon, Rainer Heintzmann, and Jerome Mertz


“Dynamic speckle illumination (DSI) provides a simple and robust technique to obtain fluorescence depth sectioning with a widefield microscope. We report a significant improvement to DSI microscopy based on a statistical image-processing algorithm that incorporates spatial wavelet prefiltering. The resultant gain in sectioning strength leads to a fundamentally improved scaling law for the out-of-focus background rejection.”

Link to Publications Page

Publication: Optics Letters
Issue/Year: Optics Letters, Vol. 32, Issue 11, pp. 1417-1419
DOI: 10.1364/OL.32.001417