Self-reference extended depth-of-field quantitative phase microscopy

Author(s): Jaeduck Jang, Chae Yun Bae, Je-Kyun Park, and Jong Chul Ye

Abstract:

“This paper describes a novel quantitative phase microscopy based on a simple self-referencing scheme using Michelson interferometry. In order to achieve the homogeneous reference field for accurate phase measurement, the imaging field-of-view (FOV) is split onto the sample and homogenous background areas. The reference field can be generated by rotating the relative position of the sample and homogenous background in the object arm. Furthermore, our system is realized using an extended depth-of-field (eDOF) optics, which allows quantitative phase measurement for an increase of the depth-of-field without moving objective lens or specimen. The proposed method is confirmed by experimental results using various samples such as polystyrene beads and red blood cells (RBCs).”

Link to Publications Page

Publication: SPIE Proceedings
Issue/Year: Proc. SPIE 7570, 757018 (2010)
DOI: 10.1117/12.843082

Individually controlled multi-focus laser processing for two-photon polymerization

Author(s): Kotaro Obata, Jürgen Koch, and Boris N. Chichkov

Abstract:

“A parallel processing of two-photon polymerization structuring is demonstrated with spatial light modulator. Spatial light modulator generates multi-focus spots on the sample surface via phase modulation technique controlled by computer generated hologram pattern. Each focus spot can be individually controlled in position and laser intensity with computer generated hologram pattern displayed on spatial light modulator. The multi-focus spots two-photon polymerization achieves the fabrication of asymmetric structure. Moreover, smooth sine curved polymerized line with amplitude of 5 μm and a period of 200 μm was obtained by fast switching of CGH pattern.”

Link to Publications Page

Publication: SPIE Proceedings / Volume 7584 / Nonlinear Processing
Issue/Year: Proc. SPIE 7584, 75840L (2010)
DOI: 10.1117/12.842117